年度	2005
全部作者	洪伟修
论文名称	Depth-profile study of the electronic structures at Ga2O3(Gd2O3) and Gd2O3-GaN interfaces by X-ray photoelectron spectroscopy
期刊名称	. T.S. Lay, Y.Y. Liao, W.H. Hung, M. Hong, J. Kwo, J.P. Mannaerts, Depth-profile study of the electronic structures at Ga2O3(Gd2O3) and Gd2O3-GaN interfaces by X-ray photoelectron spectroscopy J. Crystal Growth 278 (2005) p.624-628. 1.681
卷数	278
发表日期	2005-05-01