| Year | 2005 |
|---|---|
| Authors | Wei-Hsiu Hung |
| Paper Title | Depth-Profiling the Electronic Structures at HfO2/Si Interface Grown by Molecular Beam Epitaxy |
| Journal Title | J. Vac. Sci. Technol. B |
| Vol.No | 23 |
| Date of Publication | 2005-05-01 |
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